Humidity Cabinet Aging test chamber

The constant temperature and humidity test chamber is used to test various performance items of aerospace products, information electronic instruments, materials, electrical, electronic products, and various electronic components under high temperature or humid environment.

 

List one

Model: LK-80G Studio size: 400×500×400mm Dimensions: 650×1500×950mm

Model: LK-150G Studio size: 500×600×500mm Dimensions: 750×1600×1050mm

Model: LK-225G Studio size: 500×750×600mm Dimensions: 1000×1650×1200mm

Model: LK-408G Studio size: 600×850×800mm Dimensions: 1350×1280×2200mm

Model: LK-800G Studio size: 800×1000×1000mm Dimensions: 1100×1750×1400mm

Model: LK-010G Studio size: 1000×1000×1000mm Dimensions: 1500×1900×1600mm

Temperature range: HK:0～150℃ CK:-20～150℃ LK:-40～150℃ JK:-70～150℃

Humidity range: standard type: 20%～98% (low humidity type 5%～98%) temperature fluctuation: ±0.5℃

Temperature uniformity: ±2.0℃

Humidity fluctuation: ±2%

Humidity uniformity: ±2.5%

Heating rate: 1.0～3.0℃/min

Cooling rate: 0.7～1.2℃/min

Power source:  220V±10% or 380V±10%

[Price of small constant temperature and humidity test chamber] KW-TH-80F standard:

⒈ GB11158 high temperature test chamber technical conditions

⒉ GB10589-89 low temperature test chamber technical conditions

⒊ GB10592-89 high and low temperature test chamber technical conditions

⒋ GB/T10586-89 Technical conditions of damp heat test chamber

⒌ GB/T2423.1-2001 low temperature test chamber test method

⒍ GB/T2423.2-2001 high temperature test chamber test method

⒎ GB/T2423.3-93 Test method for damp heat test chamber

⒏ GB/T2423.4-93 alternating damp heat test method

⒐ GB/T2423.22-2001 temperature change test method

⒑ IEC60068-2-1.1990 Low temperature test chamber test method

⒒ IEC60068-2-2.1974 High temperature test chamber test method

⒓ GJB150.3 high temperature test

⒔ GJB150.4 low temperature test

⒕ GJB150.9 damp heat test